Re-examining Innovation and Patents: New Longitudinal Evidence

Download
Cite
Plain text
Fiona Yamamoto; Nathan Kim; Emma Osei (2020). Re-examining Innovation and Patents: New Longitudinal Evidence. JiaB Demo Journal, 4(4), 122–141. https://doi.org/10.5250/josm.2020.4529
BibTeX
@article{yamamoto-2020-2,
  author  = {Fiona Yamamoto and Nathan Kim and Emma Osei},
  title   = {Re-examining Innovation and Patents: New Longitudinal Evidence},
  journal = {JiaB Demo Journal},
  year    = {2020},
  volume  = {4},
  number  = {4},
  pages   = {122--141},
  doi     = {10.5250/josm.2020.4529},
}